International Journal of Terahertz Science and Technology
  TST >> Vol.2, No.3, September 2009: PP. 75-89
 

Fourier Transform Spectroscopy of Solids at Terahertz Frequencies

T J Parker *
Physics Centre, University of Essex, Colchester, Essex CO4 3SQ, UK
* E-mail: etpkr@yahoo.co.uk

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Abstract: We briefly review the techniques of dispersive Fourier transform spectroscopy (DFTS), polarised oblique incidence reflection spectroscopy and attenuated total reflection (ATR) spectroscopy, and discuss applications of these techniques to a variety of solids, including alkali halide crystals, pseudo-displacive ferroelectrics, and bulk and low-dimensional semiconductors.

Keywords: DFTS, ATR, Polarised oblique incidence reflectivity, Ionic solids, Ferroelectrics, Semiconductors.

Published: 2009-09-28

Acknowledgments: I am greatly indebted to Professor D H Martin of Queen Mary College, University of London, who first introduced me to the topic of far infrared spectroscopy of solids many years ago, and to all of my co-authors in the publications cited below, without whom this work would not have been possible.

Cite this article:
T J Parker. Fourier Transform Spectroscopy of Solids at Terahertz Frequencies[J]. International Journal of Terahertz Science and Technology, 2009, Vol.2, No.3: 75-89.  DOI:10.11906/TST.075-089.2009.09.09

URL: http://www.tstnetwork.org/10.11906/TST.075-089.2009.09.09

 

 
 

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