International Journal of Terahertz Science and Technology
  TST >> Vol.2, No.2, June 2009: PP. 68-74
 

Low Noise Receivers Using Niobium Nitride Hot Electron Bolometer Mixers from 0.76 to 3.1 THz

J. Chen 1*, M. Liang 1, L. Kang 1, B. B. Jin 1, W. W. Xu 1, P. H. Wu 1, W. Zhang 2, L. Jiang 2 and S.C. Shi 2
1 Research Institute of Superconductor Electronics (RISE), Department of Electronic Science & Engineering, Nanjing University, Nanjing, 210093, China
2 Purple Mountain Observatory, Chinese Academy of Sciences, Nanjing, 210008, China
* Tel: 86-25-83593717; Fax: 86-25-83593717; Email: chenj63@nju.edu.cn

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Abstract: Low noise receivers using quasi-optical superconducting niobium nitride (NbN) hot electron bolometer (HEB) mixers have been designed, fabricated and measured in the terahertz (THz) frequency range for THz applications in astronomy and cosmology. The NbN HEB mixers consist of a planar complementary antenna and several nanometer (nm) thick NbN bridge connecting across the antenna's inner terminals on high-resistivity Si substrates. A double sideband (DSB) receiver noise temperature of 664 K at 0.76 THz, 920 K at 1.6 THz, 1630 K at 2.5 THz and 1710 K at 3.1 THz has been obtained without corrections and no anti-reflection (AR) coating on the surface of the lens.

Keywords: Hot Electron Bolometer (HEB) mixer, Quasi-optical superconducting heterodyne detector, Terahertz (THz), Receiver noise temperature.

Published: 2009-06-30

Acknowledgments: The work was supported in part by the National Natural Science Foundation of China (NSFC) under Grant 10778602, 60721063, 60571007, and the National Basic Research Program of China (973 Program) under Grant 2006CB601006, 2007CB310404.

Cite this article:
J. Chen, M. Liang, L. Kang, B. B. Jin, W. W. Xu, P. H. Wu, W. Zhang, L. Jiang and S.C. Shi. Low Noise Receivers Using Niobium Nitride Hot Electron Bolometer Mixers from 0.76 to 3.1 THz [J]. International Journal of Terahertz Science and Technology, 2009, Vol.2, No.2: 68-74.  DOI:10.11906/TST.068-074.2009.06.08

URL: http://www.tstnetwork.org/10.11906/TST.068-074.2009.06.08

 

 
 

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