International Journal of Terahertz Science and Technology
  TST >> Vol.6, No.4, December 2013: PP. 249-257
 

(Invited paper) Mechanism and applications of weakly ionized plasma terahertz wave detector

Lei Hou, Xiaowei Han, and Wei Shi *
Xi'an University of Technology, Department of Applied Physics, No. 5, South Jinhua Road,
P. O. Box 904, Xi'an, Shaanxi 710048, China
* Email: swshi@mail.xaut.edu.cn

View Full Text: PDF

Abstract: Plasma generated in a discharged neon lamp has been successfully used for terahertz (THz) wave detection. However, the detection mechanisms are disputed. Some researchers advance that the THz wave enhances ionization current, and other researchers propose THz wave enhances diffusion current. We theoretically analyzed the detection mechanism, and found the electrons in the weakly ionized plasma could obtain energy from the incident THz radiation and convert excitation collisions of electrons with excited neutral atoms into ionization collisionsresulting in the increasing of the ionization current. An experiment was designed and testified the mechanism. Some applications of the weakly ionized plasma detector in electromagnetic wave detection and THz imaging were demonstrated.

Keywords: Terahertz wave, Plasma, Detector, Imaging.

Received: 2013-11-29

Published: 2013-12-30

Acknowledgments: This work was supported in part by the National Natural Science Foundation of China under Grant 61007060, the China Postdoctoral Science Foundation under Grant 2012M521789, Special Financial Grant form the Chinese Postdoctoral Science Foundation under Grant 2013T60883, the Doctoral Fund of Ministry of Education of China under Grant 20116118110014, , the Projects of International Cooperation of Shaanxi under Grant 2012KW-04, and the Foundation of Shaanxi Educational Commission under Grant 12JK0974.

Cite this article:
Lei Hou, Xiaowei Han, and Wei Shi.(Invited paper) Mechanism and applications of weakly ionized plasma terahertz wave detector[J]. International Journal of Terahertz Science and Technology, 2013, Vol.6, No.4: 249-257.  DOI:10.11906/TST.249-257.2013.12.18

URL: http://www.tstnetwork.org/10.11906/TST.249-257.2013.12.18

 

 
 

Print | close

Copyright© 2008 Scinco Inc. All Rights Reserved
P.O.Box 6982, Williamsburg, VA 23188, USA