International Journal of Terahertz Science and Technology
  TST >> Vol.3, No.2, June 2010: PP. 85-91

THz Transmission Properties of Metallic Slit Array

Guozhong Zhao *
Department of Physics, Capital Normal University, Beijing 100048, China
Beijing Key Lab for Terahertz Spectroscopy and Imaging
Key Lab of Terahertz Optoelectronics, Ministry of Education, China
No. 105 of XiSanHuan Bei Lu, Haidian District, Beijing 100048, China
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Abstract: Terahertz (THz) transmission spectrum of metallic slit array is studied by means of terahertz time-domain spectroscopy. Frequency-selective THz transmission of metallic slit array is shown experimentally and analyzed by numerical simulation. The results illustrate that the obvious transmission enhancement occur with the narrowing of slits. The terahertz transmission peak has a blue shift until the peak disappear when the slit width becomes larger. The transmission enhancement of metallic slit array strongly depends on the polarization of terahertz radiation. For the metallic fractal structures of slit array, the multiband including the pass band and stop band exists and their frequencies of transmission peaks are determined by the length of first-level of fractal line. The electric field distribution on the metallic fractal array of square hole shows that THz field is localized on the boundary of metallic hole. It implied that THz transmission properties of metallic mesh structure are domain by the interaction between the photon and boundary plasma of metallic slits.

Keywords: THz, Function materials, Devices, Metallic slit, Array.

Published: 2010-6-29

Acknowledgments: This work is supported by National Natural Science Foundation of China under Grant No. 50971094, Beijing Natural Science Foundation under Grant No. 1092007 and National Keystone Basic Research Program (973 Program) under Grant No. 2007CB310408 and No. 2006CB302901. It is also supported by Beijing Ren Cai Project for Education.

Cite this article:
Guozhong Zhao. THz Transmission Properties of Metallic Slit Array[J]. International Journal of Terahertz Science and Technology, 2010, Vol.3, No.2: 85-91.  DOI:10.11906/TST.085-091.2010.06.08




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