International Journal of Terahertz Science and Technology
  TST >> Vol.11, No.3, September 2018: PP. 65-72
 

(Invited Paper)Terahertz absorption spectroscopy of ammonia vapor detection based on Bi2Sr2CaCu2O8+δ intrinsic Josephson junction stacks

Hancong Sun 1*, Ya Huang 1, Xianjing Zhou 1, Xuecou Tu 1, Jun Li 1, Reinhold Kleiner 2, Valery P. Koshelets 3, Huabing Wang 1, and Peiheng Wu 1
1 Research Institute of Superconductor Electronics, Nanjing University, Nanjing 210046, People’s Republic of China
2 Physikalisches Institut and Center for Collective Quantum Phenomena in LISA+, Universität Tübingen, D-72076 Tübingen, Germany
3 Kotel’nikov Institute of Radio Engineering and Electronics, Moscow 125009, Russia
* E-mail: hancong_sun@163.com

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Abstract: We report on the application of terahertz (THz) waves radiated from Bi2Sr2CaCu2O8+δ (BSCCO) intrinsic Josephson junction (IJJ) stacks on the gas detection. The THz emission is provided by controlling the voltage across the stack, and the ammonia gas absorption peak at a frequency of about 0.572 THz was observed by adjusting the bias current for a direct and mixing detection technique. The minimum absorption linewidth turned out to be as narrow as about 5 MHz. The obtained ammonia-absorption spectra suggest that the BSCCO emitter can be an important terahertz source for potential THz applications in trace-gas detection.

Keywords: BSCCO, Terahertz emitter, Terahertz spectroscopy.

Received: 2017-12-23

Published: 2018-9-30

Acknowledgments: We gratefully acknowledge financial support from the National Natural Science Foundation of China (Grants No. 11234006, No. 61611130069), RFBR Grant No. 17-52-12051, and the Deutsche Forschungsgemeinschaft via Project No. KL930-13/2.

Cite this article:
Hancong Sun, Ya Huang, Xianjing Zhou, Xuecou Tu, Jun Li, Reinhold Kleiner, Valery P. Koshelets, Huabing Wang, and Peiheng Wu. (Invited Paper)Terahertz absorption spectroscopy of ammonia vapor detection based on Bi2Sr2CaCu2O8+δ intrinsic Josephson junction stacks[J]. International Journal of Terahertz Science and Technology, 2018, Vol.11, No.3: 65-72.  DOI:10.11906/TST.065-072.2018.09.07

URL: http://www.tstnetwork.org/10.11906/TST.065-072.2018.09.07

 

 
 

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